WebJESD47 actually has its roots in humidity-related testing of microelectronics with aluminum back-end metallization. Those results showed that the failure mechanism is aluminum corrosion, which has an activation energy of approximately 0.7 eV, which is what leads to the approximate “equivalence” of THB-1000hrs and HAST-96hrs. Web• JESD47-compliant – 100,000 (minimum) ERASE cycles per block – Data retention: 20 years (TYP) • Package – 64-ball LBGA, 11mm x 13mm (PC) • RoHS-compliant, halogen-free packaging • Automotive operating temperature – Ambient: –40°C to 105°C 2Gb: x16, 3V, MT28FW, Automotive Parallel NOR Features CCMTD-1718347970-10367
JEDEC STANDARD
WebJEDEC STANDARD IC Latch-Up Test JESD78E (Revision of JESD78D, November 2011) APRIL 2016 JEDEC SOLID STATE TECHNOLOGY ASSOCIATION Downloaded by xu … rock bee crystals
JEDEC STANDARD
WebJESD47, Stress-Test-Driven Qualification of Integrated Circuits. JEP143, Solid State Reliability Assessment and Qualification Methodologies. JEP148, Reliability Qualification of Semiconductor Devices based on Physics of Failure and Risk and Opportunity Assessment. SEMATECH White Paper #99083810A-XFR, Use Condition Based Reliability Web20 apr 2024 · Pb-free and halogen free package JESD47 4K pcs SP005409809 SP005409807 SP005409905 SP005409903 TLI493D-W2BW A0 TLI493D-W2BW A1 TLI493D-W2BW A2 TLI493D-W2BW A3 Pb-free and halogen free package JESD47 15K pcs SP005409964 SP005409966 SP005409968 SP005409970 TLE493D-A2B6 Low … http://beice-sh.com/pdf/JESD%E6%A0%87%E5%87%86/JESD22-A117E.pdf ostrich shell necklace